This report will focus on the experimental study of the beam quality attained in the two facilities by measurements of the energy deposition inside a silicon pin diode. The report will illustrate the methodology employed and its findings may be able to drive the most appropriate modifications required to ensure the quality of the beam at the two facilities.
|Work Package No.||WP5|
|Deliverable Related No.||D5.2|
|New Due Date (if delay)||n/a|
D5.2 report is not available yet.