This report will include the simulation data and results related to the calculation of the LET distribution and its evolution as it transverses the various materials in the beamline or of an electronic device. This analysis will be devoted to various levels of device integration and will provide a building block for the experimental measurements. It will also include a benchmark against measurements, such as those retrieved from solid-state detectors.
|Work Package No.||WP3|
|Deliverable Related No.||D3.4|
|New Due Date (if delay)||n/a|
D3.4 report is not available yet.